Transmission electron microscopy investigation of Bi2O3-ZnO-Nb2O5 pyrochlore and related phases

Materials Letters

Volumn 57, Issue 2, 2002, Pages 414-419

  Nino, Juan C ^a   Reaney, Ian M ^b   Lanagan, Michael T ^a   Randall, Clive A ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Dielectrics; Layered structures; Polytypes; Pyrochlore; Stacking faults; Zirconolite

Indexed keywords

CRYSTAL ORIENTATION; DIELECTRIC MATERIALS; ELECTRON DIFFRACTION; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

DARK FIELD (DF) IMAGES;

BISMUTH COMPOUNDS;

EID: 0036890273     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(02)00802-9     Document Type: Article

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