Determination of γ/γ interface types in a γ-TiAl alloy using convergent beam electron diffraction

Scripta Materialia

Volumn 47, Issue 11, 2002, Pages 757-762

  Chen, S H ^a   Schumacher, G ^a   Mukherji, D ^b   Frohberg, G ^c   Wahi, R P ^a  

^a HAHN MEITNER INSTITUT   (Germany)

^b TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^c TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Convergent beam electron diffraction; Interfaces; Titanium aluminides

Indexed keywords

BINARY ALLOYS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); MECHANICAL PROPERTIES; PHASE INTERFACES;

CONVERGENT BEAM ELECTRON DIFFRACTION; LAMELLAR STRUCTURES;

TITANIUM ALLOYS;

EID: 0036887393     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(02)00197-5     Document Type: Article

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