High count rate electron probe microanalysis

Journal of Research of the National Institute of Standards and Technology

Volumn 107, Issue 6, 2002, Pages 503-508

  Geller, Joseph D ^a   Herrington, Charles ^a  

^a Geller MicroAnalytical Laboratory   (United States)

Author keywords

Electron probe microanalysis; EPMA; Gas flow proportional detector; GFPC; Pulse pile up rejection; Sealed proportional counter; X ray; X ray detectors; XePC

Indexed keywords

ALGORITHMS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON BEAMS; FLUORESCENCE; POISSON DISTRIBUTION; STANDARDS; X RAYS;

ELECTRON PROBE MICROANALYSIS;

MICROANALYSIS;

EID: 0036874533     PISSN: 1044677X     EISSN: None     Source Type: Journal    
DOI: 10.6028/jres.107.043     Document Type: Conference Paper

References (5)

1. American National Standard for Calibration - U.S. Guide to the Expression of Uncertainty in Measurement, B.2.14, NCSL International, Boulder, Colorado, ANSI/NCSL Z540-2-1997.
2. Ibid. Sec. 2.2.3.
3. E. P. Berlin, Principles and Practice of X-ray Spectrometric Analysis, Second Edition, Plenum Press, New York (1975).
4. K. F. J. Heinrich, Electron Beam Microanalysis, Van Nostrand Reinhold Company, New York (1981).
5. J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, C. Fiori, and E. Lifshin, Scanning Electron Microscopy and Microanalysis, Plenum Press, New York (1981).