Investigations of surface characterization of silicone rubber due to tracking phenomena under a.c. and d.c. voltages

Bulletin of Materials Science

Volumn 25, Issue 6, 2002, Pages 473-475

  Rao, Uma Maheswar ^a   Majeed, S S M S Abdul ^b   Venkataseshaiah, C ^a   Sarathi, R ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^b B S ABDUR RAHMAN CRESCENT INSTITUTE OF SCIENCE AND TECHNOLOGY   (India)

Author keywords

Silicone rubber; Surface degradation; TG DTA; Tracking; WAXD

Indexed keywords

CHARACTERIZATION; DEGRADATION; DIFFERENTIAL THERMAL ANALYSIS; ELECTRIC POTENTIAL; SILICONES; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

SILICONE RUBBER; WIDE ANGLE X-RAY DIFFRACTION;

RUBBER;

EID: 0036869555     PISSN: 02504707     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02710530     Document Type: Article

References (4)

1. IEC Publication 1984 Testing method for evaluating the resistance of tracking and erosion of electrical insulating materials used under severe ambient conditions, No. 587
2. Kumagai S and Yoshimura N 2001 IEEE Trans. Dielec. Electr. Insul. 8 203
3. Kumagai S, Wang Xinsheng and Yoshimura N 1998 IEEE Trans. Dielec. Electr. Insul. 5 281
4. Yoshimura N, Kumagai S and Du B 1997 IEEE Electr. Insul. Mag. 8