360° shape measurement system for objects having from Lambertian to specular reflectance properties utilizing a novel rangefinder

Journal of Optics A: Pure and Applied Optics

Volumn 4, Issue 6, 2002, Pages

  Baba, M ^a   Narita, D ^a   Ohtani, K ^b  

^a OKAYAMA UNIVERSITY   (Japan)

^b HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

3D 360 shape measurement; Hybrid object; Lambertian object; Rangefinder; Specular object

Indexed keywords

GAIN CONTROL; IMAGE SENSORS; LIGHT SOURCES; REFLECTION; THREE DIMENSIONAL;

HYBRID OBJECT; LAMBERTIAN OBJECT; OPTICAL TECHNIQUES; SHAPE MEASUREMENT; SPECULAR OBJECT;

RANGE FINDERS;

EID: 0036864760     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/4/6/372     Document Type: Article

References (11)

1. Sanz J L C 1989 Advances in Machine Vision (New York: Springer)
2. Torras C 1992 Theory and Industrial Application (Berlin: Springer)
3. Chen F, Brown G M and Song M 2000 Overview of three-dimensional shape measurement using optical methods Opt. Eng. 39 10-22
4. Ikeuchi K 1981 Determining surface orientations of specular surfaces by using the photometric stereo method IEEE Trans. Pattern Anal. Mach. Intell. 3 661-9
5. Sanderson A C, Weiss L E. and Nayer S K 1988 Structured highlight inspection of specular surfaces IEEE Trans. Pattern Anal. Mach. Intell. 10 44-55
6. Nayer S K, Sanderson A C, Weiss L E and Simon D D 1990 Specular surface inspection using structured highlight and Gaussian images IEEE Trans. Robot. Autom. 6 208-18
7. Colenman E N and Jain R 1982 Obtain 3-dimensional shape of texture and specular surfaces using four-source photometry Comput. Graph. Image Process. 18 309-28
8. Ryu Y K and Cho H S 1996 New optical sensing system for obtaining the three-dimensional shape of specular objects Opt. Eng. 35 1483-95
9. Baba M, Kozo Ohtani K, Imai M and Konishi T 2001 New laser rangefinder for three-dimensional shape measurement of specular objects Opt. Eng. 40 53-60
10. Nayer S K, Ikeuchi K and Kanade T 1989 Surface reflection: physical and geometrical perspectives IEEE Trans. Pattern Anal. Mach. Intell. 12 402-9
11. Baba, M, Kozo Ohtani K and Konishi T 2000 A novel position measurement with subpixel resolution using charge-coupled device (CCD) Meas. Sci. Technol. 11 266-72