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Volumn 21, Issue 21, 2002, Pages 1651-1654
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Interface stability in SiC-SCS6-Ti6242 composites
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CRYSTALLOGRAPHY;
ENERGY DISPERSIVE SPECTROSCOPY;
INTERFACES (MATERIALS);
SILICON CARBIDE;
TRANSMISSION ELECTRON MICROSCOPY;
INTERFACE STABILIZATION;
COMPOSITE MATERIALS;
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EID: 0036860140
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1020848020109 Document Type: Article |
Times cited : (7)
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References (15)
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