An algorithm for soft-fault diagnosis of linear and nonlinear circuits

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications

Volumn 49, Issue 11, 2002, Pages 1648-1653

  Tadeusiewicz, Michal ^a   Halgas, Stanislaw ^a   Korzybski, Marek ^a  

^a LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Analog circuits; Soft fault diagnosis

Indexed keywords

ALGORITHMS; APPROXIMATION THEORY; CAPACITORS; ELECTRIC INDUCTORS; LINEAR NETWORKS; LINEAR PROGRAMMING; NONLINEAR NETWORKS; NUMERICAL METHODS; RESISTORS; VOLTAGE CONTROL;

ANALOG CIRCUITS; LINEAR APPROXIMATION; SIMPLEX METHOD; SOFT-FAULTS; VOLTAGE CONTROLLED CURRENT SOURCE;

ELECTRIC FAULT CURRENTS;

EID: 0036860074     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2002.804596     Document Type: Article

References (18)

1. R. M. Biernacki and J. W. Bandler, "Multiple-fault location of analog circuits," IEEE Trans. Circuits Syst. I, vol. CAS-28, pp. 361-367, May 1981.
2. J. W. Bandler, R. M. Biernacki, and A. E. Salama, "A linear programming approach to fault location in analog circuits," in Proc. IEEE Int. Symp. Circuits and Systems., Chicago, IL, 1981, pp. 256-260.
3. 1 norm," in Proc. IEEE Int. Symp. Circuits and Systems, Rome, Italy, 1982, pp. 1140-1143.
4. Z. F. Huang, C. S. Lin, and R. W. Liu, "Node-fault diagnosis and design of testability," IEEE Trans. Circuits Syst. I, vol. CAS-30, pp. 257-265, May 1983.
5. A. E. Salama, J. A. Starzyk, and J. W. Bandler, "A unified decomposition approach for fault location in large analog networks," IEEE Trans. Circuits Syst. I, vol. CAS-31, pp. 609-622, July 1984.
6. J. Rutkowski and A. Macura, "Multiple fault location in AC circuits," Proc. Inst. Elect. Eng. G, pp. 279-284, 1986.
7. T. Ozawa, Analog Methods for Computer Aided Circuit Analysis and Diagnosis. New York: Marcel Dekker, 1988.
8. G. N. Stenbakken, T. M. Souders, and G. W. Stewart, "Ambiguity groups and testability," IEEE Trans. Instrum. Meas., vol. 38, pp. 941-947, Oct. 1989.
9. V. C. Prasad, S. N. R. Pinjala, and K. G. Murty, "Mixed integer programming method for faulty diagnosis of linear analogue circuits," Electron Lett., vol. 28, pp. 1184-1185, 1992.
10. D. S. Kim and P. H. Seong, "Automatic fault diagnosis method for resistive networks using multiple excitations," Int. J. Circuit Theory Appl., vol. 24, pp. 467-477, 1996.
11. G. Fedi, S. Manetti, M. C. Piccirilli, and J. A. Starzyk, "Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits," IEEE Trans. Circuits Syst. I, vol. 46, pp. 779-787, July 1999.
12. F. Li and P. Y. Woo, "The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method," IEEE Trans. Circuits Syst. I, vol. 46, pp. 1222-1227, Oct. 1999.
13. J. A. Starzyk, J. Pang, S. Manetti, M. C. Piccirilli, and G. Fedi, "Finding ambiguity groups in low testability analog circuits," IEEE Trans. Circuits Syst. I, vol. 47, pp. 1125-1137, Aug. 2000.
14. M. Tadeusiewicz and M. Korzybski, "A method for fault diagnosis in linear electronic circuits," Int. J. Circuit Theory Appl., vol. 28, pp. 245-262, 2000.
15. M. Tadeusiewicz and S. Halgas, "An algorithm for soft-fault diagnosis of DC circuits," in Proc. Eur. Conf. Circuit Theory and Design, Espoo, Finland, 2001, pp. I-245-I-248.
16. J. A. Starzyk and D. Liu, "Multiple fault diagnosis of analog circuits based on large change sensitivity analysis," in Proc. Eur. Conf. Circuit Theory and Design, Espoo, Finland, 2001, pp. I-241-I-244.
17. M. Simonnard, Programmation Lineaire. Paris, France: Dunod, 1962.
18. G. Sierksma, Linear and Integer Programming: Theory and Practice. New York: Marcel Dekker, 1996.