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Volumn 197, Issue 1-2, 2002, Pages 155-164

Shape analysis of current pulses delivered by semiconductor detectors: A new tool for fragmentation studies of high velocity atomic clusters and molecules

Author keywords

Atomic clusters; Fragmentation; Shape analysis; Silicon detectors

Indexed keywords

ATOMIC PHYSICS; ELECTRIC CURRENTS; ELECTRIC FIELD EFFECTS; SENSITIVITY ANALYSIS;

EID: 0036859601     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)01309-5     Document Type: Article
Times cited : (32)

References (18)
  • 9
    • 0003412161 scopus 로고
    • The stopping and range of ions in solids
    • New York: Pergamon
    • Ziegler J.F., Biersack J.P. The Stopping and Range of Ions in Solids. 1985;Pergamon, New York.
    • (1985)
    • Ziegler, J.F.1    Biersack, J.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.