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Volumn 197, Issue 1-2, 2002, Pages 155-164
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Shape analysis of current pulses delivered by semiconductor detectors: A new tool for fragmentation studies of high velocity atomic clusters and molecules
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Author keywords
Atomic clusters; Fragmentation; Shape analysis; Silicon detectors
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Indexed keywords
ATOMIC PHYSICS;
ELECTRIC CURRENTS;
ELECTRIC FIELD EFFECTS;
SENSITIVITY ANALYSIS;
ATOMIC CLUSTERS;
SHAPE ANALYSIS;
SILICON SENSORS;
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EID: 0036859601
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(02)01309-5 Document Type: Article |
Times cited : (32)
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References (18)
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