The relevance of interactions in nanoparticle systems - Application to particulate thin films

Particle and Particle Systems Characterization

Volumn 19, Issue 5, 2002, Pages 312-320

  Günther, Lydia ^a   Peukert, Wolfgang ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Dip coating; Hydration force; Particle interactions; Structure formation

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROLYTES; HYDRATION; NANOTECHNOLOGY; PARTICLES (PARTICULATE MATTER); PH EFFECTS; SCANNING; SHEAR STRENGTH; SURFACE ROUGHNESS; THIN FILMS; VISCOSITY;

DIP COATING;

NANOSTRUCTURED MATERIALS;

EID: 0036858299     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4117(200211)19:5<312::AID-PPSC312>3.0.CO;2-I     Document Type: Conference Paper

References (26)

1. H. Rumpf, Über die Eigenschaften von Nutzstäuben. Staub - Reinhalt. Luft 1967, 27, 3-13.
2. J. Krekel, R. Polke, Quality Assurance in Process Development. Chem. Ing. Tech. 1992, 64, 528-535.
3. B. Derjaguin, L. Landau, A Theory of the Stability of Strongly Charged Lyophobic Sols and the Coalescence of Strongly Charged Particles in Electrolyte Solution. Acta Phys. Chim. USSR 1941, 14, 633.
4. E.J.W. Verwey, J.T.G. Overbeek, Theory of the Stability of Lyophobic Colloids. Elsevier Pub. Comp., New York, 1948.
5. C. Mende, F. Stenger, W. Peukert, J. Schwedes, Mechanische Erzeugung und Stabilisierung von Nanopartikeln in Rührwerkskugelmühlen. Chem. Ing. Tech. (submitted).
6. A. Mersmann, Crystallization Technology Handbook, 2nd edition. Marcel Dekker, New York, 2001.
7. K.L. Wolf, Physik und Chemie der Grenzflächen. Springer Verlag, Berlin, 1959.
8. W. Peukert, F. Stenger, J. Schwedes, Comminution in Stirred Bali Mills. Short Course, Braunschweig, 2000.
9. D.H. Napper, Polymeric Stabilization of Colloidal Dispersions. Academic Press, London, 1983.
10. A.S. Dukhin, P.J. Goetz, Acoustic and Electroacoustic Spectroscopy. Langmuir 1996, 12, 4336-4344.
11. W. Peukert, C. Mehler, M. Götzinger: Novel Concepts for Characterization of Heterogeneous Particulate Surfaces. J. Appl. Surf. Sci. 2002 (in press).
12. W. Peukert, C. Mehler, M. Götzinger, Application of Adsorption and Adhesion Measurements for Particle Surface Characterisation. Part. Part. Syst. Charact. 2001, 18, 229-234.
13. L.E. Scriven, Physics and Applications of Dip-Coating and Spin-Coating. Mater. Res. Soc. Symp. Proc. 1988, 121, 717-729.
14. P.R. Schunk, A.J. Hurd, C.J. Brinker, Free-meniscus Coating Processes, in Liquid Film Coating (Eds.: S.F. Kistler, P.M. Schweizer), Chapman and Hall, London, 1997, pp. 673-708.
15. L.D. Landau, V.G. Levich, Dragging of a Liquid by a Moving Plate. Acta Phys. Chim. USSR 1942, 17, 42-54.
16. H. Yotsumoto, R.H. Yoon, Application of Extended DLVO Theory, II: Stability of Silica Suspensions. J. Colloid Interface Sci. 1993, 157, 434-441.
17. N.V. Churaev, B.V. Derjaguin, Inclusion of Structural Forces in the Theory of Stability of Colloids and Films. J. Colloid Interface Sci. 1985, 103, 542-553.
18. D. Schiby, E. Ruckenstein, The Role of the Polarization Layers in Hydration Forces. Chem. Phys. Lett. 1983, 95, 435-438.
19. R.M. Pashley, Hydration Forces Between Mica Surfaces in Electrolyte Solutions. Adv. Colloid Interface Sci. 1982, 16, 57-62.
20. J.N. Israelachvili, H. Wennerström, Hydration or Steric Forces between Amphiphilic Surfaces. Langmuir 1990, 6, 873-876.
21. R.K. Iler, The Chemistry of Silica. Wiley, New York, 1979.
22. H. Kamiya, M. Mitsui, H. Takano, S. Miyazawa, Influence of Particle Diameter on Surface Silanol Structure, Hydration Forces, and Aggregation Behavior of Alkoxide-Derived Silica Particles. J. Am. Ceram. Soc. 2000, 83, 287-293.
23. G. Lagaly, Dispersionen und Emulsionen. Dr. Dietrich Steinkopff Verlag, Darmstadt, 1997.
24. H. Sonntag, K. Strenge, Coagulation Kinetics and Structure Formation. Plenum Press, New York, 1987.
25. J.N. Israelachvili, Intermolecular and Surface Forces. Academic Press, London, 1992.
26. L. Günther, W. Peukert: Einfluß der Solstabilität auf die Struktur tauchgezogener partikulärer Schichten. Chem. Ing. Tech. 2001, 73, 1439-1443.