A novel silicon array designed for intraoperative charged particle imaging

Medical Physics

Volumn 29, Issue 11, 2002, Pages 2529-2540

  Tornai, Martin P ^a   Patt, Bradley E ^b   Iwanczyk, Jan S ^b   Tull, Carolyn R ^b   MacDonald, Lawrence R ^b   Hoffman, Edward J ^c  

^a DUKE UNIVERSITY MEDICAL CENTER   (United States)

^b Photon Imaging Inc   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Beta imaging; Biomedical nuclear imaging; Intraoperative imaging; Positron sensitive particle detectors; Si strip

Indexed keywords

DATA ACQUISITION; DATA HANDLING; ELECTRONS; OPTICAL COLLIMATORS; PIXELS; POSITRON EMISSION TOMOGRAPHY; POSITRONS; SILICON; SILICON COMPOUNDS; SURGERY;

BACKGROUND CORRECTION; BIOMEDICAL NUCLEAR IMAGING; CONVERSION ELECTRONS; INTRA-OPERATIVE IMAGING; INTRINSIC RESOLUTION; POSITRON SENSITIVE PARTICLE DETECTORS; RANGE BLURRING EFFECTS; SEMICONDUCTOR IMAGING;

MONTE CARLO METHODS;

SILICON; DIAGNOSTIC AGENT;

ALPHA RADIATION; ARTICLE; CALIBRATION; CAMERA; CANCER DIAGNOSIS; CANCER SURGERY; COLLIMATOR; DEVICE; DIAGNOSTIC IMAGING; ELECTRON; GAMMA RADIATION; INFORMATION PROCESSING; IRRADIATION; MONTE CARLO METHOD; NOISE; OPTICAL INSTRUMENTATION; PHANTOM; PITCH; POSITRON; PRIORITY JOURNAL; RADIATION ENERGY; RADIOSENSITIVITY; ROOM TEMPERATURE; SCINTILLATION; SEMICONDUCTOR; SIGNAL NOISE RATIO; SIMULATION; SPECTRUM; BETA RADIATION; COMPUTER ASSISTED EMISSION TOMOGRAPHY; COMPUTER ASSISTED SURGERY; ELECTRODE; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; IMAGE ENHANCEMENT; IMAGE QUALITY; INSTRUMENTATION; METHODOLOGY; PATIENT MONITORING; RADIOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER; VALIDATION STUDY;

ALPHA PARTICLES; BETA RAYS; CALIBRATION; ELECTRODES; ELECTRONS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MINIATURIZATION; MONITORING, INTRAOPERATIVE; MONTE CARLO METHOD; PHANTOMS, IMAGING; RADIOMETRY; REPRODUCIBILITY OF RESULTS; SEMICONDUCTORS; SENSITIVITY AND SPECIFICITY; SILICON; SURGERY, COMPUTER-ASSISTED; TOMOGRAPHY, EMISSION-COMPUTED; TRANSDUCERS;

EID: 0036852525     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.1514241     Document Type: Article

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