Group-delay ripple reduction in step-chirped fiber Bragg gratings by using laser-beam written step-chirped phase masks

IEEE Photonics Technology Letters

Volumn 14, Issue 11, 2002, Pages 1554-1556

  Komukai, Tetsuro ^a,b   Inui, Tetsuro ^a,b   Kurihara, Masaaki ^c   Fujimoto, Shigekazu ^c  

^a IEEE   (Japan)

^b NTT Network Innovation Laboratories   (Japan)

^c DAI NIPPON PRINTING CO LTD   (Japan)

Author keywords

Chirped fiber Bragg grating (FBG); Electron beam; Group delay ripple; Laser beam; Phase error; Phase mask; Stitching error

Indexed keywords

GROUP-DELAY RIPPLE REDUCTION; LASER-BEAM WRITTEN STEP-CHIRPED PHASE MASKS; PHASE ERROR; STEP-CHIRPED FIBER BRAGG GRATINGS; STITCHING ERROR;

ELECTRON BEAMS; INTEGRATED CIRCUIT MANUFACTURE; LASER BEAMS; LIGHT REFLECTION; MASKS; PHASE SHIFT;

FIBER BRAGG GRATINGS;

EID: 0036851941     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2002.803367     Document Type: Article

References (9)

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