Small-angle X-ray scattering and wide-angle X-ray diffraction on thermally annealed nanostructured TiO2 films

Thin Solid Films

Volumn 419, Issue 1-2, 2002, Pages 105-113

  Lavčević, M Lučić ^a   Turkovic A ^b  

^a UNIVERSITY OF SPLIT   (Croatia)

^b RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

Nanostructures; Small angle X ray scattering; Titanium oxide; Wide angle X ray diffraction

Indexed keywords

ANNEALING; FILM PREPARATION; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; SURFACE STRUCTURE; TITANIUM DIOXIDE; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

TWO-PHASE SYSTEMS;

THIN FILMS;

EID: 0036849796     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00774-5     Document Type: Article

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