A unique facility for surface microscopy

Materials Science and Engineering: B

Volumn 96, Issue 2, 2002, Pages 215-220

  Devlin, C L H ^a   Futaba, D N ^a   Loui, A ^a   Shine, J D ^a   Chiang, S ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

LEEM; STM; Surface microscopy; Ultrahigh vacuum

Indexed keywords

ELECTRON MICROSCOPES; IMAGE ANALYSIS; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROMETERS;

SURFACE MICROSCOPY;

SURFACE STRUCTURE;

EID: 0036840679     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00320-3     Document Type: Conference Paper

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