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Volumn 56, Issue 4, 2002, Pages 435-447

Single particle characterization and manipulation by opposite field dielectrophoresis

Author keywords

Characterization; DEP; Dielectrophoresis; Electrode; Manipulation; Yeast DNA

Indexed keywords

DNA; ELECTRODES; ELECTROPHORESIS; ELEMENTARY PARTICLES; YEAST;

EID: 0036839838     PISSN: 03043886     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3886(02)00109-2     Document Type: Article
Times cited : (25)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.