Direct feature extraction in a foveated environment

Pattern Recognition Letters

Volumn 23, Issue 13, 2002, Pages 1537-1548

  Nattel, Efri ^a   Yeshurun, Yehezkel ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Active vision; Edge detection; Foveated vision; Hough transform; Interest operators; Log polar mapping; Spatial masks; Symmetry operators

Indexed keywords

HOUGH TRANSFORMS; IMAGE ANALYSIS;

FOVEATED ENVIRONMENT;

PATTERN RECOGNITION;

IMAGE ANALYSIS;

EID: 0036832984     PISSN: 01678655     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-8655(02)00117-4     Document Type: Article

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