Modeling, calibration, and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors

IEEE Transactions on Instrumentation and Measurement

Volumn 51, Issue 5, 2002, Pages 996-1001

  Dileepan, Joseph ^a   Collins, Steve ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

CMOS image sensors; Fixed pattern noise; Logarithmic pixels

Indexed keywords

CALIBRATION; CMOS INTEGRATED CIRCUITS; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER; SPURIOUS SIGNAL NOISE;

FIXED PATTERN NOISE; LINEAR RESPONSE; LOGARITHMIC IMAGE SENSORS; NONLINEAR ILLUMINATION;

IMAGE SENSORS;

EID: 0036825995     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2002.807803     Document Type: Article

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