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Volumn 49 II, Issue 5, 2002, Pages 2492-2496
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The digital front-end electronics for the space-borne INTEGRAL-SPI experiment: ASIC design, design for test strategies and self-test facilities
a
CEA SACLAY
(France)
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Author keywords
Application specific integrated circuit (ASIC) design; Built in self test; Design for test
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Indexed keywords
APPLICATION SPECIFIC INTEGRATED CIRCUITS;
BUILT-IN SELF TEST;
COMPUTER PROGRAMMING LANGUAGES;
COMPUTER SIMULATION;
DESIGN FOR TESTABILITY;
INTEGRATED CIRCUIT LAYOUT;
SATELLITES;
TEST FACILITIES;
DIGITAL FRONT END ELECTRONICS;
SATELLITE SPACECRAFT;
VERY HIGH SPEED INTEGRATED CIRCUIT DESCRIPTION LANGUAGE;
GAMMA RAY SPECTROMETERS;
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EID: 0036816538
PISSN: 00189499
EISSN: None
Source Type: Journal
DOI: 10.1109/TNS.2002.803855 Document Type: Article |
Times cited : (4)
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References (3)
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