Linear stochastic analysis of polluted insulator leakage current

IEEE Transactions on Power Delivery

Volumn 17, Issue 4, 2002, Pages 1063-1069

  Amarh, Felix ^a   Karady, George G ^a   Sundararajan, Raji ^b  

^a Arizona State University   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Envelope; Extreme value; Insulators; Leakage current; Pollution; Signature analysis

Indexed keywords

CURRENT DENSITY; DATA ACQUISITION; ELECTRIC INSULATORS; FLASHOVER; PROBABILITY; STATISTICAL METHODS;

CONTAMINATED INSULATORS;

LEAKAGE CURRENTS;

EID: 0036815558     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2002.800878     Document Type: Article

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