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Volumn 17, Issue 4, 2002, Pages 1037-1043

Voltage sag and recovery time in repetitive events

Author keywords

Power quality; Recovery time; Repetitive event; Voltage sag

Indexed keywords

ELECTRIC LOADS; ELECTRIC POTENTIAL; ELECTRIC SPARKS; RECLOSING CIRCUIT BREAKERS;

EID: 0036814416     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2002.803840     Document Type: Article
Times cited : (56)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.