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Volumn 58, Issue 10, 2002, Pages o604-o605

2-aminoanilinium phosphite

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL STRUCTURE; DIFFRACTOMETERS; HYDROGEN BONDS; INORGANIC ACIDS; LATTICE CONSTANTS; MOLECULES; NEGATIVE IONS; REFLECTION; SINGLE CRYSTALS;

EID: 0036803954     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270102015184     Document Type: Article
Times cited : (5)

References (18)
  • 17
    • 5444263403 scopus 로고    scopus 로고
    • University of G̈ttingen, Germany
    • Sheldrick, G. M. (1997). SHELXL97. University of G̈ttingen, Germany.
    • (1997) SHELXL97
    • Sheldrick, G.M.1
  • 18
    • 0003409324 scopus 로고
    • Siemens; Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Siemens (1991). XSCANS User's Manual. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1991) XSCANS User's Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.