Calculation of optical constants in porous silicon thin films using diffused and specular reflectance measurement

Surface Review and Letters

Volumn 9, Issue 5-6, 2002, Pages 1821-1825

  Pena C ^a   Torres, J ^a  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

CALCULATION; CONFERENCE PAPER; ELECTROCHEMISTRY; FILM; LIGHT SCATTERING; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; OPTICS; OSCILLATOR; POROSITY; REFLECTOMETRY; SIMULATION;

EID: 0036800615     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x02004475     Document Type: Conference Paper

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