Porous silicon dielectric function modeling from effective medium theories

Surface Review and Letters

Volumn 9, Issue 5-6, 2002, Pages 1631-1635

  Campos, A M ^a   Torres, J ^a   Giraldo, J J ^a  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

CONFERENCE PAPER; DIELECTRIC CONSTANT; GRAVIMETRY; MOLECULAR MODEL; POROSITY; REFRACTION INDEX; SPECTROSCOPY; STRUCTURE ANALYSIS;

EID: 0036797579     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x02004116     Document Type: Conference Paper

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