Sintering and electrical properties of tantalum anodes for capacitor applications

Materials Letters

Volumn 56, Issue 4, 2002, Pages 560-563

  Balaji, T ^a   Govindaiah, R ^a   Sharma, M K ^a   Purushotham, Y ^a   Kumar, Arbind ^a   Prakash, T L ^a  

^a CENTRE FOR MATERIALS FOR ELECTRONICS TECHNOLOGY C MET   (India)

Author keywords

Compaction; CV value; Sintering; Tantalum powder

Indexed keywords

CAPACITANCE; CAPACITORS; COMPACTION; ELECTRIC POTENTIAL; ELECTRON BEAMS; IMPURITIES; PARTICLE SIZE ANALYSIS; SINTERING; TANTALUM; THERMOANALYSIS;

GREEN DENSITY; TANTALUM ANODES;

ANODES;

EID: 0036795245     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-577X(02)00552-9     Document Type: Article

References (12)

1. K. Kumar, International scenario in capacitor industry, Electronics Information and Planning, July-August, 2000, 272 pp.
2. U.S. Patent No. 4940490.
3. L.D. Cunningham, Columbium (niobium and tantalum), Mineral Commodity Summaries, 1998, UI.
4. Tantalum-Niobium International Study Center (TIC) Bull. No. 104, Dec. 1998.
5. Tantalum capacitors: global trends in 2000. Passive Compon. Ind. Jan-Feb. 2000;24. Feature article.
6. Technical Service Report No. STC-101, Shin-Estu Chemical Industry, Tokyo, Japan, Aug. 1969.
7. Aris F.C., Lewis T.J. J. Phys. D. 6:1973;1067.
8. Aris F.C., Lewis T.J. Proc. Br. Ceram. Soc. 23:1972;115.
9. Jones M.W., Hughes D.M. J. Phys. D. 7:1974;112.
10. Klein G.P. J. Electrochem. Soc. 113:1966;348.
11. Trifonova V., Girginow A. J. Electroanal. Chem. 107:1980;105.
12. Tierman M., Millard R.J. Proc. IEEE, 1983 Electronic Comp. Conf. 1983;157.