Microscopic phase-shifting profilometry based on digital micromirror device technology

Applied Optics

Volumn 41, Issue 28, 2002, Pages 5896-5904

  Zhang, Chengping ^a   Huang, Peisen S ^a   Chiang, Fu Pen ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036794110     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.005896     Document Type: Article

References (13)

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