Analysis of asymmetric broadening of X-ray diffraction peak profiles caused by randomly distributed polarized dislocation dipoles and dislocation walls

Journal of Applied Crystallography

Volumn 35, Issue 5, 2002, Pages 589-593

  Groma, I ^a   Monnet, G ^a  

^a EÖTVÖS LORÁND UNIVERSITY   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; DIPOLE; POLARIZATION; X RAY DIFFRACTION;

EID: 0036792217     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802010695     Document Type: Article

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