OMNIBUS: A program for reduction, modelling and viewing X-ray single-crystal data from various four-circle diffractometers

Journal of Applied Crystallography

Volumn 35, Issue 5, 2002, Pages 641-643

  Galdecka E ^a  

^a INSTITUTE OF LOW TEMPERATURE AND STRUCTURE RESEARCH   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL STRUCTURE; INFORMATION PROCESSING; MEASUREMENT; MODEL; REFLECTOMETRY; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

EID: 0036790023     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802010580     Document Type: Article

References (6)

1. Diamond, R. (1969). Acta Cryst. A25, 43-55 [in particular §3.1, points (i), (ii) and (iii)].
2. Galdecka, E. (1996). Acta Cryst. A52, C-44.
3. Galdecka, E. (1999). J. Appl. Cryst. 32, 827-832.
4. Lehmann. M. S. & Larsen. F. K. (1974). Acta Cryst. A30, 580-584.
5. Maes. S. T. Vanhulle, C. & Lenstra, A. T. H. (1998). Acta Cryst. A54, 399-410.
6. Prince, E., Wilkinson, C. & McIntyre, G. J. (1997). J. Appl. Cryst. 30, 133-137.