Surface studies of partially fluorinated polymethacrylates: A combined XPS and LEIS analysis

Progress in Organic Coatings

Volumn 45, Issue 2-3, 2002, Pages 273-279

  Van de Grampel, R D ^a   Ming, W ^a   Gildenpfennig, A ^b   Van Gennip, W J H ^c   Krupers, M J ^d   Laven, J ^a   Niemantsverdriet, J W ^c   Brongersma, H H ^b   Van der Linde, R R ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Calipso LEIS Expertise Centre   (Netherlands)

^c DUTCH POLYMER INSTITUTE DPI   (Netherlands)

^d TNO   (Netherlands)

Author keywords

Fluorinated polymethacrylates; LEIS; Stratification; Surface analysis; XPS

Indexed keywords

COATINGS; COPOLYMERS; INTERFACIAL ENERGY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

STRATIFICATION; SURFACE ANALYSIS;

POLYMETHYL METHACRYLATES;

EID: 0036788746     PISSN: 03009440     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0300-9440(02)00043-7     Document Type: Conference Paper

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