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Volumn 49, Issue 10, 2002, Pages 1121-1129

Model selection in electromagnetic source analysis with an application to VEFs

Author keywords

EEG and MEG source analysis; Goodness of fit; Model selection; Source localization; Visual evoked fields

Indexed keywords

ELECTROENCEPHALOGRAPHY; ELECTROMAGNETISM;

EID: 0036785213     PISSN: 00189294     EISSN: None     Source Type: Journal    
DOI: 10.1109/TBME.2002.803543     Document Type: Article
Times cited : (20)

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