SCOPUS 정보 검색 플랫폼

Applied Physics A: Materials Science and Processing

Volumn 75, Issue 4, 2002, Pages 515-518

Threshold electrical switching in As45Te55-xInx and As50Te50-xInx glasses

(4) Devaraju, J T a Sharmila, B H b Asokan, S b Acharya, K V a

a BANGALORE UNIVERSITY (India)

b INDIAN INSTITUTE OF SCIENCE (India)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ARSENIC COMPOUNDS; COMPOSITION EFFECTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC PROPERTIES; QUENCHING; VOLTAGE MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

COMPOSITION DEPENDENCE; MELT QUENCHING; SWITCHING VOLTAGE; THRESHOLD ELECTRICAL SWITCHING;

SEMICONDUCTING GLASS;

EID: 0036778720 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390101013 Document Type: Article

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.