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Volumn 21, Issue 3, 2002, Pages 85-94

Quantitative detection of the defects in thin-walled pressure vessels with holography and shearing speckle interferometry

Author keywords

Holography; Pressure vessels; Shearing speckle interferometry

Indexed keywords

CRACKS; HOLOGRAPHY; INTERFEROMETRY; PRESSURE VESSELS;

EID: 0036766737     PISSN: 01959298     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022532705891     Document Type: Article
Times cited : (15)

References (8)
  • 2
    • 0004129997 scopus 로고    scopus 로고
    • Holographic interferometry
    • P.K. Rastogi, Ed.; (Springer-Verlag).
    • P.K. Rastogi, Ed., Holographic interferometry, (Springer-Verlag, 1994).
    • (1994)
  • 3
    • 0004044474 scopus 로고
    • Speckle metrology
    • R.S. Sirohi, Ed.; (Marcel Dekker, New York).
    • R.S. Sirohi, Ed., Speckle metrology, (Marcel Dekker, New York, 1993).
    • (1993)
  • 4
    • 33748760823 scopus 로고    scopus 로고
    • Shearography: A novel and practical approach for nondestructive testing
    • Y.Y. Hung, Shearography: a novel and practical approach for nondestructive testing, J. Nondestru. Testing 8 (2); pp. 55-67 (1998).
    • (1998) J. Nondestru. Testing , vol.8 , Issue.2 , pp. 55-67
    • Hung, Y.Y.1
  • 5
    • 0020133918 scopus 로고
    • Shearography: A new optical method for strain measurement and nondestructive testing
    • Y.Y. Hung, Shearography: a new optical method for strain measurement and nondestructive testing, Opt. Eng. 21 (3), pp. 391-395 (1982).
    • (1982) Opt. Eng. , vol.21 , Issue.3 , pp. 391-395
    • Hung, Y.Y.1
  • 6
    • 0033285633 scopus 로고    scopus 로고
    • Applications of digital shearography for testing of composite structures
    • Y.Y. Hung, Applications of digital shearography for testing of composite structures, Composites Part B, 30, pp. 765-773 (1999).
    • (1999) Composites Part B , vol.30 , pp. 765-773
    • Hung, Y.Y.1
  • 7
    • 0012609547 scopus 로고    scopus 로고
    • On-site detection of seam weld defects by using electronic speckle pattern interferometry
    • X. Li, X. Liu, and Z. Chen, On-site detection of seam weld defects by using electronic speckle pattern interferometry, Acta Photon. Sini. 27 (10), 911-918 (1998).
    • (1998) Acta Photon. Sini. , vol.27 , Issue.10 , pp. 911-918
    • Li, X.1    Liu, X.2    Chen, Z.3
  • 8
    • 0004129997 scopus 로고    scopus 로고
    • Holographic interferometry
    • (Springer-Verlag, Berlin).
    • T. Kreis, Holographic interferometry, (Springer-Verlag, Berlin, 1996).
    • (1996)
    • Kreis, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.