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Volumn 32, Issue 9, 2002, Pages 753-755
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Defect-deformation nanometer self-organisation upon laser recrystallisation of thin amorphous films on substrates
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Author keywords
Amorphous films; Defect deformation self organisation; Laser recrystallisation
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Indexed keywords
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EID: 0036766155
PISSN: 10637818
EISSN: None
Source Type: Journal
DOI: 10.1070/QE2002v032n09ABEH002287 Document Type: Article |
Times cited : (1)
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References (10)
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