GIS and remote sensing for detecting yield loss in cranberry culture

Journal of Nematology

Volumn 34, Issue 3, 2002, Pages 207-212

  Oudemans, Peter V ^a   Pozdnyakova, Larisa ^a   Hughes, Marilyn G ^b   Rahman, Faiz ^c  

^a RUTGERS UNIVERSITY   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c BALL STATE UNIVERSITY   (United States)

Author keywords

Database analysis; GIS; Perennial crop management; Remote sensing; Unsupervised classification; Yield loss; Yield mapping

Indexed keywords

EID: 0036762622     PISSN: 0022300X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (22)

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