Crystallographic and magnetic properties of CoAl0.2Fe1.8O4 thin films prepared by a Sol-Gel method

IEEE Transactions on Magnetics

Volumn 38, Issue 5 I, 2002, Pages 2628-2630

  Kim, Sam Jin ^a   Jeong, Kwang Ho ^b   Kim, Chul Sung ^a  

^a Kookmin University   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

Atomic force microscopy; Co ferrite; Coercivity; Sol gel method; Thin film; Vibrating sample magnetometer

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; COBALT COMPOUNDS; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; MAGNETOMETERS; SILICON WAFERS; SOL-GELS; SURFACE ROUGHNESS; THERMOGRAVIMETRIC ANALYSIS; THERMOOXIDATION; X RAY DIFFRACTION;

DIFFERENTIAL THERMAL ANALYSIS (DTA);

THIN FILMS;

EID: 0036761673     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.801965     Document Type: Article

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