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Volumn 38, Issue 5 I, 2002, Pages 1964-1966

Signal and noise characteristics of patterned media

Author keywords

Noise; Patterned media; Signal

Indexed keywords

FOURIER TRANSFORMS; JITTER; MAGNETIC FLUX; MAGNETIC PERMEABILITY; MAGNETIZATION; SCANNING ELECTRON MICROSCOPY; SPURIOUS SIGNAL NOISE; TRANSDUCERS;

EID: 0036761652     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2002.802787     Document Type: Article
Times cited : (15)

References (7)
  • 1
    • 0002311627 scopus 로고    scopus 로고
    • The recording and reproducing processes
    • C.D. Mee and E.D. Daniel, Eds. New York: MCGraw-Hill, ch. 2
    • B.K. Middleton, "The recording and reproducing processes," in Magnetic Recording Technology, 2nd ed, C.D. Mee and E.D. Daniel, Eds. New York: MCGraw-Hill, 1996, ch. 2, pp. 2.1-2.72.
    • (1996) Magnetic Recording Technology, 2nd ed , pp. 21-272
    • Middleton, B.K.1
  • 2
    • 0033184308 scopus 로고    scopus 로고
    • Read channels for patterned media
    • Sept.
    • G.F. Hughes, "Read channels for patterned media" IEEE Trans. Magn., vol. 35, pp. 2310-2312, Sept. 1999.
    • (1999) IEEE Trans. Magn. , vol.35 , pp. 2310-2312
    • Hughes, G.F.1
  • 3
    • 0030141495 scopus 로고    scopus 로고
    • Analytical formulas for the unshielded magnetoresistive head
    • May
    • S. Shtrikman and D.R. Smith, "Analytical formulas for the unshielded magnetoresistive head," IEEE Trans. Magn., vol. 32, pp. 1987-1994, May 1996.
    • (1996) IEEE Trans. Magn. , vol.32 , pp. 1987-1994
    • Shtrikman, S.1    Smith, D.R.2
  • 4
    • 0030246507 scopus 로고    scopus 로고
    • A reciprocity-based approach to understanding magnetic force microscopy
    • Sept.
    • C.D. Wright and E.W. Hill, "A reciprocity-based approach to understanding magnetic force microscopy," IEEE Trans. Magn., vol. 32, pp. 4144-4146, Sept. 1996.
    • (1996) IEEE Trans. Magn. , vol.32 , pp. 4144-4146
    • Wright, C.D.1    Hill, E.W.2
  • 6
    • 0029368294 scopus 로고
    • Field emitter array mask patterning using laser interference lithography
    • J.P. Spallas, A.M. Hawryluk, and D.R. Kania, "Field emitter array mask patterning using laser interference lithography," J. Vac. Sci. Technol. B, vol. 13, pp. 1973-1978, 1995.
    • (1995) J. Vac. Sci. Technol. B , vol.13 , pp. 1973-1978
    • Spallas, J.P.1    Hawryluk, A.M.2    Kania, D.R.3
  • 7
    • 0030247518 scopus 로고    scopus 로고
    • Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography
    • Sept.
    • A. Fernandez, P.J. Bedrossian, S.L. Baker, S.P. Vernon, and D.R. Kania, "Magnetic force microscopy of single-domain cobalt dots patterned using interference lithography," IEEE Trans. Magn., vol. 32, pp. 4472-4474, Sept. 1996.
    • (1996) IEEE Trans. Magn. , vol.32 , pp. 4472-4474
    • Fernandez, A.1    Bedrossian, P.J.2    Baker, S.L.3    Vernon, S.P.4    Kania, D.R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.