Statistical assessment of self-affine methods applied to short profiles

Fractals

Volumn 10, Issue 3, 2002, Pages 373-386

  González, Virgilio A ^a   Chacón, Oscar ^a   Hinojosa, M'Oisés ^a   Guerrero, Carlos ^a  

^a UNIVERSIDAD AUTÓNOMA DE NUEVO LEÓN   (Mexico)

Author keywords

Roughness; Self Affinity; Short Profiles; Statistical Assessment

Indexed keywords

EID: 0036758492     PISSN: 0218348X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218348X02001166     Document Type: Article

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