Radiation-induced defects in CoO- and NiO-doped fluoride, phosphate, silicate and borosilicate glasses

Glass Science and Technology: Glastechnische Berichte

Volumn 75, Issue 5, 2002, Pages 243-253

  Möncke, Doris ^a   Ehrt, Doris ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; DOPING (ADDITIVES); IONIZING RADIATION; NICKEL; QUENCHING; RADIATION DAMAGE; ULTRAVIOLET RADIATION; X RAY ANALYSIS;

RADIATION-INDUCED DEFECTS;

BOROSILICATE GLASS;

EID: 0036755237     PISSN: 09467475     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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