Simple accurate approximation of likelihood profiles

Journal of Computational and Graphical Statistics

Volumn 11, Issue 3, 2002, Pages 714-732

  Chen, Jian Shen ^a   Jennrich, Robert I ^a  

^a CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

EM applications; Integration methods; Likelihood ratio intervals; Maximum likelihood estimation; Nonlinear regression; Parameter trace; Signed root deviance profile

Indexed keywords

EID: 0036749904     PISSN: 10618600     EISSN: None     Source Type: Journal    
DOI: 10.1198/106186002493     Document Type: Article

References (11)

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