Fault diagnosis of electronic systems using artificial intelligence

IEEE Instrumentation and Measurement Magazine

Volumn 5, Issue 3, 2002, Pages 16-20

  Fenton, Billy ^a,b   McGinnity, Martin ^b   Maguire, Liam ^b  

^a International Test Technologies   (Ireland)

^b UNIVERSITY OF ULSTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; DATA COMPRESSION; DIGITAL CIRCUITS; FUZZY SETS; KNOWLEDGE ACQUISITION; PROBABILITY; VECTORS;

FAULT DIAGNOSIS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0036749344     PISSN: 10946969     EISSN: None     Source Type: Journal    
DOI: 10.1109/MIM.2002.1028367     Document Type: Article

References (7)

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2. W.G. Fenton, T.M. McGinnity, and L.E Maguire, "Fault diagnosis of electronic systems using intelligent techniques: A review," IEEE Trans. Syst., Man, Cybern. C, pp. 269-281, Aug. 2001.
3. J. de Kleer and B.C. Williams, "Multiple fault diagnosis," Artif. Intell., vol. 32, pp. 163-196,1987.
4. J. Kolodner, Case-Based Reasoning. San Mateo, CA: Morgan Kaufmann, 1993.
5. J.W. Sheppard and W.R. Simpson, Eds., Research Perspectives and Case Studies in System Test and Diagnosis. Norwell, MA: Kluwer, 1998.
6. W.R. Simpson and J.W. Sheppard, System Test and Diagnosis. Norwell, MA: Kluwer, 1994.
7. J.J. Taylor, "A standard for test and diagnosis," Research Perspectives and Case Studies in System Test and Diagnosis, W. Sheppard and W.R. Simpson, Eds. Norwell, MA: Kluwer, 1998.