An improved prediction of series resistance in spiral inductor modeling with Eddy-current effect

IEEE Transactions on Microwave Theory and Techniques

Volumn 50, Issue 9, 2002, Pages 2202-2206

  Ooi, Ban Leong ^a   Xu, Dao Xian ^a   Kooi, Pang Shyan ^a   Lin, Fu Jiang ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Deembedding; Eddy current; Quality factor; Series resistance; Skin effect; Spiral inductor

Indexed keywords

COMPUTER SIMULATION; EDDY CURRENT TESTING; ELECTRIC INDUCTORS; ELECTRIC RESISTANCE; EQUIVALENT CIRCUITS; MATHEMATICAL MODELS; SCATTERING PARAMETERS; SKIN EFFECT;

PROXIMITY EFFECT; QUALITY FACTOR; SPIRAL INDUCTOR;

MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;

EID: 0036734910     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.802337     Document Type: Article

References (9)

1. Spiral inductor substrate loss modeling in silicon RFIC's
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5. Analysis, design and optimization of spiral inductors and transformers for Si RF IC's
6. Modeling of spiral inductors on lossy substrates for RFIC
7. Modeling of spiral inductors on lossy substrates for RFIC applications
8. Investigation of current crowding effect on spiral inductors
9. An approximate dynamic spatial Green's function for microstrip lines