Reliability databases in perspective

IEEE Transactions on Reliability

Volumn 51, Issue 3, 2002, Pages 294-310

  Cooke, Roger ^a   Bedford, Tim ^b  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF STRATHCLYDE   (United Kingdom)

Author keywords

Censoring; Colored poisson process; Competing risk; Dependent censoring; Dependent competing risk; Maintenance model; Reliability database

Indexed keywords

DATA COMPRESSION; DATA REDUCTION; DATABASE SYSTEMS; MATHEMATICAL MODELS; POISSON DISTRIBUTION; RISK ASSESSMENT;

COLORED POISSON PROCESS; DEPENDENT COMPETING RISK; MAINTENANCE MODEL; RELIABILITY DATABASES;

RELIABILITY THEORY;

EID: 0036733245     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2002.802889     Document Type: Article

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