Structural refinement of liquid-phase epitaxial-grown LiNbO3 films by simulation of X-ray rocking curve

Journal of Crystal Growth

Volumn 244, Issue 1, 2002, Pages 70-77

  Kaigawa, Kazuyuki ^a   Yamamura, Yoshihiko ^a   Kumazawa, Youichiro ^a   Kawaguchi, Tatsuo ^a   Imaeda, Minoru ^a   Sakai, Hiroaki ^a   Tsurumi, Takaaki ^b  

^a NGK INSULATORS LTD   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

A1. High resolution X ray diffraction; A1. Interface; A3. Liquid phase epitaxy; B1. Lithum compounds; B1. Niobates; B2. Nonlinear optic materials

Indexed keywords

COMPOSITION; COMPUTER SIMULATION; COMPUTER SOFTWARE; FILM GROWTH; INTERFACES (MATERIALS); LATTICE CONSTANTS; LITHIUM NIOBATE; THICKNESS MEASUREMENT; X RAY DIFFRACTION;

X-RAY ROCKING CURVES;

LIQUID PHASE EPITAXY;

EID: 0036723351     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01608-1     Document Type: Article

References (21)