Microstructural and compositional characterization of a new silicon carbide nanocables using scanning transmission electron microscopy

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 15, Issue 1, 2002, Pages 1-5

  Yu, D P ^a,b   Xing, Y J ^b   Tence, M ^c   Pan, H Y ^b   Leprince Wang, Y ^a  

^a National Centre of Scientific Research   (France)

^b PEKING UNIVERSITY   (China)

^c UNIVERSITÉ PARIS SUD   (France)

Author keywords

EELS; Nanocables; Nanostructures; TEM

Indexed keywords

CRYSTALLIZATION; ELECTRON ENERGY LOSS SPECTROSCOPY; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; SILICA; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

NANOCABLES;

SILICON CARBIDE;

EID: 0036723166     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(02)00444-7     Document Type: Article

References (12)