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Volumn 307-310, Issue , 2002, Pages 135-141

X-ray diffraction and Raman scattering measurements on silica xerogels

Author keywords

[No Author keywords available]

Indexed keywords

DENSIFICATION; PORE SIZE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECIFIC HEAT; X RAY SCATTERING;

EID: 0036722897     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(02)01451-5     Document Type: Conference Paper
Times cited : (14)

References (27)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.