SCOPUS 정보 검색 플랫폼

Volumn 74, Issue 5, 2002, Pages 539-544

Perturber's charge effect on Stark broadened hydrogen lines in helium plasmas

Author keywords

Hydrogen line shape; Microfield distribution function

Indexed keywords

COMPUTER SIMULATION; CONCENTRATION (PROCESS); IONS; PLASMAS;

HYDROGEN LINES;

HELIUM;

PLASMA;

EID: 0036722445 PISSN: 00224073 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-4073(01)00270-9 Document Type: Article

Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.