Effect of electron exposure on optical properties of aluminized polyimide film

Journal of Materials Research

Volumn 17, Issue 9, 2002, Pages 2442-2446

  Li, Chundong ^a   Yang, Dezhuang ^a   He, Shiyu ^a   Mikhailov, M M ^b  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

^b TOMSK STATE UNIVERSITY OF CONTROL SYSTEMS AND RADIOELECTRONICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANNEALING; COMPUTER SIMULATION; ELECTRON IRRADIATION; LIGHT ABSORPTION; LIGHT REFLECTION; OPTICAL FILMS; RADIATION EFFECTS; REFLECTOMETERS;

ALUMINIZED POLYIMIDE FILMS; ELECTRON ENERGY; ELECTRON FLUX; ELECTRON IRRADIATION FLUENCE; SOLAR ABSORPTANCE; SPECTRAL REFLECTANCE;

POLYIMIDES;

EID: 0036709331     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2002.0356     Document Type: Article

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