Process modeling by Bayesian latent variable regression

AIChE Journal

Volumn 48, Issue 8, 2002, Pages 1775-1793

  Nounou, Mohamed N ^a   Bakshi, Bhavik R ^a   Goel, Prem K ^b   Shen, Xiaotong ^b  

^a Ohio State University   (United States)

^b OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL SYSTEM ANALYSIS; DATA REDUCTION; LINEAR SYSTEMS; MATHEMATICAL MODELS; REGRESSION ANALYSIS; STATISTICAL METHODS;

FAULT DIAGNOSIS;

INDUSTRIAL ENGINEERING;

DATA PROCESSING; FAULT DIAGNOSIS; MONITORING; PROCESS CONTROL; STATISTICAL ANALYSIS;

ACCURACY; ARTICLE; BAYES THEOREM; MAXIMUM LIKELIHOOD METHOD; PROCESS CONTROL; PROCESS MODEL; PROCESS MONITORING; QUANTITATIVE ANALYSIS; REGRESSION ANALYSIS; STATISTICAL ANALYSIS;

EID: 0036706987     PISSN: 00011541     EISSN: None     Source Type: Journal    
DOI: 10.1002/aic.690480818     Document Type: Article

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