Electrostrictive strain in low-permittivity dielectrics

Journal of Electroceramics

Volumn 8, Issue 2, 2002, Pages 87-98

  Yimnirun, Rattikorn ^a   Moses, Paul J ^a   Newnham, Robert E ^a   Meyer Jr , Richard J ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Dielectrics; Electrostriction; Interferometer; Low permittivity

Indexed keywords

ELECTROSTRICTION; GLASS CERAMICS; INTERFEROMETERS; PERMITTIVITY; THERMAL STRESS;

ELECTROSTRICTIVE STRAIN;

DIELECTRIC MATERIALS;

EID: 0036703494     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1020543610685     Document Type: Article

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