Study of the resistivity mapping in CdTe: Cl-correlation with annealing and Te-precipitates

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 4, 2002, Pages 1954-1959

  Ayoub, M ^a,b   Hage Ali, M ^b   Zumbiehl, A ^b   Regal, R ^b   Koebel, J M ^b   Rit, C ^b   Fougeres P ^c   Siffert, P ^b  

^a Faculté de Médecine   (France)

^b UNIVERSITÉ DE STRASBOURG   (France)

^c EURORAD   (France)

Author keywords

Annealing; CdTe: Cl; Resistivity mapping; Te precipitates; Time dependent charge measurement (TDCM); Uniformity

Indexed keywords

ANNEALING; APPROXIMATION THEORY; CRYSTALS; ELECTRIC CONDUCTIVITY; PRECIPITATION (CHEMICAL);

SPATIAL RESOLUTION;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0036703089     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.801519     Document Type: Article

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