Method for measuring material deformation with linear CCD detectors

Guangdian Gongcheng/Opto-Electronic Engineering

Volumn 29, Issue 4, 2002, Pages 20-23

  Wang, Qing You ^a   Yu, Juan Hui ^a   Guo, Qing ^a   Zhang, Sheng Bin ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Deformation measurement; Linear CCD; Non contact measurement; Stress measurement

Indexed keywords

DATA ACQUISITION; DEFORMATION; STRESS ANALYSIS;

LINER CHARGE COUPLED DEVICE; NONCONTACT MEASUREMENT;

CHARGE COUPLED DEVICES;

EID: 0036700218     PISSN: 1003501X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)