Chemical effects in Auger electron spectra of aluminium

Surface and Interface Analysis

Volumn 34, Issue 1, 2002, Pages 356-359

  Timmermans, B ^a   Vaeck, N ^a   Hubin, A ^b   Reniers, F ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^b VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

AES; Aluminium; Chemical effects; Cluster model; Theoretical modelling

Indexed keywords

ALUMINUM COMPOUNDS; ATOMS; AUGER ELECTRON SPECTROSCOPY; COMPOSITION EFFECTS; COMPUTATIONAL METHODS; CRYSTAL LATTICES; ELECTRONIC STRUCTURE; FERMI LEVEL; MATHEMATICAL MODELS; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER EMISSION PROCESS; AUGER MAPPING; CHEMICAL EFFECT; SIGNAL ANALYSIS TECHNIQUE;

ALUMINUM;

EID: 0036692777     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1316     Document Type: Conference Paper

References (11)